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SEM Calibration Specimens
The PDF below has more details about all products listed on this page. Please note that the PDF opens in a new browser window. This webpage will remain behind the opened PDF.
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Click Here for PDF with Images and Specifications |
| Product Name | Ref. |
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POLYSTY LATEX SPH-0.091um-5ML | P404 | ADD » |
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No Longer Available | P405 | ADD » |
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No Longer Available | P406 | ADD » |
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POLYSTY LATEX SPH-0.225UM-5ML | P407 | ADD » |
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No Longer Available | P408 | ADD » |
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No Longer Available | P409 | ADD » |
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Poly. latex Sph. 0.855um (not 0.945um) 5ml | P410 | ADD » |
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GOLD ON CARBON TEST SPEC -1 | S120 | ADD » |
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Gold on Carbon test specimen for short pin stub | S120/S | ADD » |
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GOLD ON CARBON JEOL STUB-1 | S194 | ADD » |
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GOLD ON CARBON ISI STUB-1 | S195 | ADD » |
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GOLD ON CARBON HITACHI STUB-1 | S196 | ADD » |
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Ultra high resolution testspecimen (gold) on 12.5mm dia. pin stub | S326 | ADD » |
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RES TEST 2nm -30nm ISI STUB AU-1 | S326I | ADD » |
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RES TEST 2nm-30nm JEOL STUB AU-1 | S326J | ADD » |
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PLANOTEC SILICONE TEST 12.5 PIN- | S327 | ADD » |
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Ultra high resolution test specimen (gold) on 12.5mm dia. pin stub | S328 | ADD » |
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U. High Res. Au Test Specimen (1nm) On Hitachi Stub | S328H | ADD » |
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U. High Res. Au Test Specimen (1nm) On ISI Stub | S328I | ADD » |
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U. High Res. Au Test Specimen (1nm) On JEOL Stub | S328J | ADD » |
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SILICON TEST SPECIMEN-1 | S336 | ADD » |
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CERTIFICATE OF ACCURACY-1 | S336/C | ADD » |
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SILICON SPEC FOR ILM-1 | S350 | ADD » |
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Low kV gold on carbon test specimen on 12.5mm pin stub | S435 | ADD » |
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Low kV gold on carbon test specimen on 15mm Hitachi stub | S435/H | ADD » |
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Low kV gold on carbon test specimen on ISI stub | S435/I | ADD » |
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Low kV gold on carbon test specimen on 10mm JEOL stub | S435/J | ADD » |
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Low kV gold on carbon test specimen on 12.5mm JEOL stub | S435/JB | ADD » |
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Low kV gold on carbon test specimen on 12.5mm short pin stub | S435/S | ADD » |
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Low kV tin on carbon test specimen on 12.5mm pin stub | S436 | ADD » |
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Low kV tin on carbon test specimen on 15mm Hitachi stub | S436/H | ADD » |
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Low kV tin on carbon test specimen on ISI stub | S436/I | ADD » |
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Low kV tin on carbon test specimen on 10mm JEOL stub | S436/J | ADD » |
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Low kV tin on carbon test specimen on 12.5mm JEOL stub | S436/JB | ADD » |
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Tin on carbon medium res. SEM test specimen on 12.5mm pin stub | S437 | ADD » |
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Tin on carbon medium res. SEM test specimen on 15mm Hitachi stub | S437/H | ADD » |
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Tin on carbon medium res. SEM test specimen on ISI stub | S437/I | ADD » |
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Tin on carbon medium res. SEM test specimen on 10mm JEOL stub | S437/J | ADD » |
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Tin on carbon medium res. SEM test specimen on 12.5mm JEOL stub | S437/JB | ADD » |
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SEM MED RES & GREY LEVEL TEST SPEC-1 | S604 | ADD » |
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